| Photon energy | 1486.61eV |
| Spectrum type | valence |
| Resolution | 20 |
| Lens Mode | ARM22 |
| Dwell Time | 0.1 |
| Step size | 0.05 |
| Number of scans | 18 |
| Name | PdO reference |
| Ex situ preparation | Cut off a piece from a 0.1 mm thick polycristalline Pd foil (Alfa Aesar, 99,9% purity) |
| In situ preparation | cleaned by several Ar+ sputtering and annealing cycles (in 0.5 mbar O2) at 700°C to soak out impurities. The Pd foil was oxidized in 0.5mbar O2 at 450°C and afterwards cooled down in O2. The reference spectra of PdO are then measured in vacuum at RT. |
| Measurement Date | 13-02-2019 |
| Condition | Value | Units |
|---|---|---|
| pressure | 1E-8 | mbar |
| Temperature | 30 | °C |
| Analyzer Mode | FAT |
| Area | 0,8 |
| Strength | 150W |
| Source Beam Size | 0,8 |
| Take Off Angle | 90 |
| Analyzer Acceptance Angle | 22 |
| Laboratory | Surface Analytics |
| Instrument | Phoibos NAP-150 |
| Protocol | ISO 15472:2010 |
| Calibration date | 14-01-2019 |
| Binding Energy | 368.29 |
| Emission line | Ag 3d5/2 |
