| Photon energy | 1486.61eV |
| Spectrum type | survey |
| Resolution | 120 |
| Lens Mode | small area |
| Dwell Time | 0.5 |
| Step size | 0.5 |
| Number of scans | 20 |
| Name | Cu reference |
| In situ preparation | sputter cleaned |
| Additional Information | Cu foil sputter cleaned after being placed in vacuum |
| Measurement Date | 21-09-2017 |
| Condition | Value | Units |
|---|---|---|
| pressure | 5e-9 | mbar |
| temperature | 25 | C |
| Analyzer Mode | FAT |
| Area | 0.3 mm diameter |
| Strength | 70 W, 13 kV |
| Source Beam Size | 0.3 mm diameter |
| Take Off Angle | 90 degrees |
| Analyzer Acceptance Angle | 22 degrees |
| Laboratory | Surface Analytics |
| Instrument | Phoibos NAP-150 |
| Protocol | ISO 15472:2001 |
| Calibration date | 20-09-2017 |
| Binding Energy | 83.98 |
| Emission line | Au 4f7/2 |
| Binding Energy | 932.67 |
| Emission line | Cu 2p3/2 |
| Emission line | fermi |
